• Lead development of iJTAG (IEEE 1687) based test solutions, including scan network modeling, instrument access, and test pattern execution.
  • Design and implement DFT methodologies including scan, BIST, and hierarchical access mechanisms.
  • Build AI/ML features in DFT tools for pattern compaction, failure prediction, and scan-failure root-cause analysis
  • Develop scalable automation frameworks in Python/C++ and streamline DFT workflows using Tcl/Perl/Shell
  • Build APIs and pipelines for Large-scale data ingestion (ATE logs, STIL/WGL patterns) and data processing and visualization dashboards