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Mark Applied
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Postdoc- Multiscale Optical and Scanning Probe of Integrated Semiconductor Interfaces (16869)
Oak Ridge, Tennessee, United States
OnsiteFull Time, Temporary
PhD in physical science or engineering (≤5 years since completion), expertise in scanning probe microscopy or optical spectroscopy, strong experimental and communication skills, ability to work independently and collaboratively.
Photoinduced Force Microscopy (PiFM), Kelvin probe force microscopy, Scanning microwave impedance microscopy, Cathodoluminescence, Raman spectroscopy, Electron microscopy, Atomic Force Microscopy (AFM), Python, MATLAB