3 thin film engineer jobs at 3 companies in Washington, DC

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Microfabrication Engineer
Greenbelt, Maryland, United States
OnsiteFull Time
ADNET Systems
ADNET Systems: Provider of information systems and scientific research services to government agencies.
3+ YOE3+ years hands-on MEMS/semiconductor fabrication; photolithography, thin-film deposition, etching; DOE; problem solving; strong communication; US citizenship or permanent residency.
Photolithography, PVD, CVD, ALD, RIE, DRIE, Ellipsometry, Microscopy, Electrical Probing, DOE
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Sr. Detector/Instrument Engineer
Greenbelt, Maryland, United States
$120k-$175k/yr OnsiteFull Time
Columbus Technologies and Services
Columbus Technologies and Services: Provides technical and engineering services for government aerospace missions.
3+ YOEBachelors in engineering or related field required, MS/PhD preferred; 3+ years in semiconductor or MEMS fabrication; experience with photolithography, thin film deposition, etching, metrology; strong troubleshooting and documentation skills.
photolithography, stepper tools, E-beam lithography, Physical vapor deposition, thermal evaporation, e-beam evaporation, sputtering, Chemical vapor deposition (PECVD), Thermal oxidation, Atomic Layer Deposition (ALD), wet chemical etching, plasma-based dry etching (RIE), Deep Reactive Ion Etching (DRIE), vapor HF, XeF2, optical microscopy, electron microscopy, Ellipsometry
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Senior Material Science and Growth Engineer
Washington, District of Columbia, United States
$165k-$234k/yr OnsiteFull Time
Besxar
Besxar: Builds off‑Earth foundries that manufacture ultra‑high‑purity semiconductor materials using the natural ultra‑high vacuum of space.
5+ YOEBSc in materials/electrical/semiconductor discipline (or equivalent), 5+ years in semiconductor materials and growth (epitaxy/thin films), hands‑on MBE/CVD/PVD/ALD experience, SEM/XRD/spectroscopy characterization, and ability to operate vacuum deposition systems.
MBE, CVD, PVD, ALD, sputtering, evaporation, SEM, XRD, spectroscopy, AFM, TEM, XPS, photoluminescence, ellipsometry, RHEED